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Prediction of yield strength in WTaVTiCr refractory high entropy alloys via measurement of temperature coefficient of resistivity

Prediction of yield strength in WTaVTiCr refractory high entropy alloys via measurement of temperature coefficient of resistivity

저자

K.N. Yoon, I.H. Kim, J.K. Kim, E.S. Park

저널 정보

JALCOM1036 (2025) 182004

출간연도

2025

Kook Noh Yoon, Il Hwan Kim, Jae Kwon Kim, Eun Soo Park, “Prediction of yield strength in WTaVTiCr refractory high entropy alloys via measurement of temperature coefficient of resistivity”, JALCOM 1036 (2025) 182004.