Home Prediction of yield strength in WTaVTiCr refractory high entropy alloys via measurement of temperature coefficient of resistivity
저자
K.N. Yoon, I.H. Kim, J.K. Kim, E.S. Park
저널 정보
JALCOM, 1036 (2025) 182004
출간연도
2025
링크
https://doi.org/10.1016/j.jallcom.2025.182004
Kook Noh Yoon, Il Hwan Kim, Jae Kwon Kim, Eun Soo Park, “Prediction of yield strength in WTaVTiCr refractory high entropy alloys via measurement of temperature coefficient of resistivity”, JALCOM 1036 (2025) 182004.